Compact structural design, with a more precise and tight arrangement between the X-ray tube, sample, and detector, significantly enhances signal strength.
User-friendly panoramic + micro-area dual-camera design allows for more comprehensive observation of samples, with micro-area cameras achieving resolutions down to the nanometer level for faster and more convenient testing.
The radiation optical system employs the latest international multi-capillary technology, providing signal strength several levels higher than that of metal collimation systems.
Multiple capillaries can be selected, such as @ 25 μm, 15 μm, and 5 μm FWHM, to meet user testing requirements.
The beam size of the multi-capillary focusing optical components can be as small as 5 μm, allowing for measurements in micro-areas that conventional metal collimators cannot measure.
Unique optical devices can measure ultra-micro areas of microelectronic products, advanced circuit boards, connectors, pin frames, and chips.